YZPST-FFC3SY 850-55.8-S
6 month ago
No. |
Test Item |
Requirements |
Test standard and condition |
1 |
Vibration |
No visible damage |
f=10~55Hz ;a=±0.35mm f=10~55Hz ;a=±0.35mm Test duration per axis = 10 frequency cycles (3 axes offset from each other by 90°) , 1 octave/min |
2 |
Environmental |
No visible damage Δ C/C≤±1% ,tgδ≤ 1.2×tanδ0+1×10‐4 (100Hz) |
θA =‐40℃, θ B =+85℃ 5cycles Duration: 2 hours, switchine period≤3min |
3 |
Thermal stability |
C :( 100 Hz ) Δ C /C0≤±0.5% tanδ( 100 Hz ) tanδ≤ 1.2× tanδ0+1×10‐4 Δ C/C < ±0.5% , tanδ≤ 1.2×tgδ0+1×10‐4 at 100Hz |
Test temperature :normal temperature Applied current :1Irms Frequency :10KHz Duration: ≥8h During the last 1 hour, the case temperature shall be measured at least 4 times; throughout this period of 1 hour, the temperature rise shall not increase by more than 1 K. |
4 |
Damp heat, Steady state |
) No visible damage Δ C/C≤±5% tanδ≤ 1.2×tanδ0+1×10‐4 RC≥ RC0 * 50% at 100Hz |
Temperature: 40℃±2℃ Humidity:80%~85%RH Duration: 66 days |
5 |
Endurance |
Δ C/C≦±3% tanδ≤ 1.2×tanδ0+1×10‐4 |
Apply 1.35Un, 70℃, running 250hours; discharge by 1.4Ip, 1000 times; Apply 1.35Un, 70℃, running 250hours |

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Main Product:
Semiconductor Triac,
Semiconductor Thyristor,
Semiconductor Module ,
Power Diode,
Silicon Transistor,
Bridge Rectifier
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