ST2258C-3min-V1.1_20251010_14024528
2 month ago
Product details
Overview
2.1 Basic Functions and Basis Standards:
The ST2258C multi-functional digital four-probe tester is a multi-purpose and intelligent comprehensive measurement instrument that uses the four-probe measurement principle to test the resistivity/block resistance of materials. This instrument is designed in accordance with GB/T 1551-2009 "Method for Determining the Resistivity of Silicon Single Crystals", GB/T 1551-1995 "Direct Current Two-Probe Method for Determining the Resistivity of Silicon and Germanium Single Crystals", GB/T 1552-1995 "Direct Current Four-Probe Method for Determining the Resistivity of Silicon and Germanium Single Crystals", etc., and also refers to the American A.S.T.M standard.
2.2 Instrument set composition: It consists of the ST2258C four-probe main unit, optional four-probe probes, optional four-probe test bench, etc.
2.3 Advantages and Characteristics:
This tester is specially equipped with an automatic classification function for test results, with a maximum classification of 10 categories.
2: Customizable USB communication interface, facilitating its expansion into a test module in an integrated test system.
The 3:8 range ultra-wide measurement range is industry-leading. Peers usually offer five to six grades.
4: The instrument is miniaturized and integrates manual and automatic functions.
5: The instrument is easy to operate and has stable performance. All parameter Settings and function conversions are input through a digital keyboard, which is simple and eliminates the instability of analog positioners.
2.4 Probe Selection: According to the characteristics of different materials, there are multiple types of probes available for selection. For details, please refer to the "Four-Probe Probe Model Specification Feature Selection Reference Table"
It is equipped with highly wear-resistant tungsten carbide probes, such as the ST2253-F01 type, to test the resistivity/square resistance of hard materials like silicon and other semiconductors, metals, and conductive plastics.
It is equipped with spherical or flat-head gold-plated copper alloy probe probes that do not damage the film, such as the ST2558B-F01 type, which can measure the resistivity/square resistance of conductive films such as metal foil and carbon paper, as well as conductive coating films on substrates such as ceramics, glass or PE films, such as metal coating, spray coating, ITO film, capacitive convolutional film and other materials.
When equipped with dedicated foil-coated probes, such as the ST2558B-F02 model, it can also test the resistivity/square resistance of foil-coated materials on lithium battery electrode sheets, etc.
By changing to the four-terminal test fixture, the body resistance of the resistor can also be measured.
2.5 Test bench options: According to the requirements of different material properties, there are multiple types of test benches available for selection. For details, please refer to the "Reference Table for Model, Specification and Feature Selection of Four-Probe Test Bench"
For testing solid or thin film materials by the four-probe method, the SZT-A type, SZT-B type (electric), SZT-C type (rapid constant pressure), or SZT-F type (solar cell) test bench can be selected.
For testing slender rod materials by the two-probe method, the SZT-K type test bench is selected as an option.
The SZT-G type test bench is selected for the parallel four-knife method test of rubber and plastic materials.
2.6 Scope of Application: This instrument is suitable for testing the electrical conductivity of conductors, semiconductors, and semiconductor-like materials by the four-probe method in semiconductor material factories, device factories, research institutions, and universities.
Iii. Basic Technical Parameters
1. Measurement range, resolution (in parentheses, it can be extended down by one order of magnitude)
Electrical resistance: 10.0×10-6 to 200.0×103 Ω, resolution: 1.0×10-6 to 0.1×103Ω
(1.0×10 -6to 20.00×10 ³ Ω, resolution 0.1×10 -6to 0.01×10 ³ Ω)
Resistivity: 10.0×10 -6to 200.0×10 ³ Ω-cm Resolution: 1.0×10 -6to 0.1×10 ³ Ω-cm
(1.0×10 -6to 20.00×10 ³ Ω-cm resolution 0.1×10 -6to 0.01×10 ³ Ω-cm)
Block resistance: 50.0×10 -6to 900.0×10 3Ω/□ Resolution: 5.0×10 -6to 0.5×10 3Ω/□
(5.0×10 -6to 100.0×10 ³ Ω/□ Resolution 0.5×10 -6to 0.1×10 ³ Ω/□)
2. Material dimensions (determined by the optional test bench and test method)
Straight diameter: The direct testing mode of the SZT-B/C/F square test bench is 180mm×180mm, and the handheld mode is not limited
Length (height) : The direct test mode on the test bench is H≤100mm, and the handheld mode is not limited.
Measurement orientation: Both axial and radial directions are acceptable
3.3 Range division and Error grades
|
Full-scale display |
200.0 |
20.00 |
2.000 |
200.0 |
20.00 |
2.000 |
200.0 |
20.00 |
|
Test current |
0.1μA |
1.0μA |
10μA |
100μA |
1.0mA |
10mA |
100mA |
1.0A |
|
Conventional range |
kΩ-cm/□ |
kΩ-cm/□ |
Ω-cm/□ |
mΩ-cm/□ |
||||
|
Basic error |
±2%FSB ±4LSB |
±1.5%FSB ±4LSB |
±0.5%FSB±2LSB |
±1.0%FSB ±4LSB |
||||
3.4 Four-probe probe (Optional one or all)
Tungsten carbide probe: Φ0.5mm, linear probe spacing 1.0mm, probe pressure: adjustable from 0 to 2kg
(2) Thin-film square resistance probe: Φ0.7mm, straight or square probe spacing 2.0mm, probe pressure: adjustable from 0 to 0.6kg
3.5. Power Supply
Input: AC 220V±10%,50Hz power consumption: <20W
3.6. Dimensions and weight:
Main unit: 220mm (length) × 245mm (width) ×100mm (height), net weight: ≤2.5kg
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SUZHOU JINGGE ELECTRONICS CO., LTD.
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5 month
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